Investigation of Anisotropic Heat Transport Through Frequency Domain Thermoreflectance Technique
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Thermophysical properties of thin film materials are of great importance for thermal management in devices including transistors, lasers, sensors, and plasmonic structures. In this thesis, I examine the characterization of heat transport in anisotropic materials through frequency domain thermoreflectance (FDTR) technique. Firstly, I describe the experimental setup and numerical modeling of the FDTR. Then, I explain the development of beam offset frequency domain thermoreflectance (BO-FDTR) and frequency domain magneto-optical Kerr effect (FD-MOKE) used to measure the anisotropic thermal properties with enhanced sensitivity. Monte Carlo computational method is also explained for uncertainty calculations. Finally, the demonstrations of measuring in-plane and out-of-plane thermal conductivities, and thermal boundary conductance with the metallic layer of anisotropic materials including 2D layered materials and printed films made of 2D-materials based inks are discussed. The measured thermal properties will be helpful for device applications that take advantage of the promising qualities of emerging 2D materials.