Investigation of Anisotropic Heat Transport Through Frequency Domain Thermoreflectance Technique

Thermophysical properties of thin film materials are of great importance for thermal management in devices including transistors, lasers, sensors, and plasmonic structures. In this thesis, I examine the characterization of heat transport in anisotropic materials through frequency domain thermoreflectance (FDTR) technique. Firstly, I describe the experimental setup and numerical modeling of the FDTR. Then, I explain the development of beam offset frequency domain thermoreflectance (BO-FDTR) and frequency domain magneto-optical Kerr effect (FD-MOKE) used to measure the anisotropic thermal properties with enhanced sensitivity. Monte Carlo computational method is also explained for uncertainty calculations. Finally, the demonstrations of measuring in-plane and out-of-plane thermal conductivities, and thermal boundary conductance with the metallic layer of anisotropic materials including 2D layered materials and printed films made of 2D-materials based inks are discussed. The measured thermal properties will be helpful for device applications that take advantage of the promising qualities of emerging 2D materials.